Applications focused on ICP/MS - page 1

Analysis of Sulfuric Acid Using a Single Set of Operating Conditions with HR-ICP-MS

Applications

| 2016 | Thermo Fisher Scientific

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of ultratrace elements in semiconductor grade TMAH developer

Applications

| 2018 | Thermo Fisher Scientific

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications

| 2015 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS

Applications

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Direct Analysis of Zirconium-93 in Nuclear Site Decommissioning Samples by ICP-QQQ

Applications

| 2020 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental

High-Throughput, Multi-Element Analysis of Milk and Milk Powder Using ICP-MS

Applications

| 2021 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Analysis of Forensic Glass Samples by Laser Ablation ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Resolution of 176 Yb and 176 Lu interferences on 176 Hf to enable accurate 176 Hf/177 Hf isotope ratio analysis using ICP-QQQ with MS/MS

Applications

| 2017 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental