Applications focused on ICP/MS | LabRulez ICPMS

High-Speed Environmental Analysis Using the Agilent 7500cx with Integrated Sample Introduction System – Discrete Sampling (ISIS–DS)

Applications

| 2009 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

Applications

| 2015 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Low-level lead speciation and isotope ratio analysis by GC-MC-ICP-MS

Applications

| 2019 | Thermo Fisher Scientific

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Thermo Fisher Scientific

Industries

Environmental

Low-level lead speciation and isotope ratio analysis by GC-MC-ICP-MS

Applications

| 2019 | Thermo Fisher Scientific

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Thermo Fisher Scientific

Industries

Environmental, Materials Testing

Determination of toxic elements in milk powder using Shimadzu ICPMS 2030

Applications

| 2018 | Shimadzu

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Shimadzu

Industries

Food & Agriculture

Quantitative characterization of silica nanoparticles by asymmetric flow FFF‑MALS‑ICP‑QQQ using the Agilent 8800 ICP‑QQQ

Applications

| 2016 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Materials Testing

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Low-level speciated analysis of Cr(III) and Cr(VI) using LC(IC)-ICP-MS

Applications

| 2012 | Agilent Technologies

HPLC, ICP/MS, Speciation analysis

Instrumentation

HPLC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Environmental

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications

| 2015 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications focused on ICP/MS | LabRulez ICPMS

High-Speed Environmental Analysis Using the Agilent 7500cx with Integrated Sample Introduction System – Discrete Sampling (ISIS–DS)

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Low-level lead speciation and isotope ratio analysis by GC-MC-ICP-MS

Low-level lead speciation and isotope ratio analysis by GC-MC-ICP-MS

Determination of toxic elements in milk powder using Shimadzu ICPMS 2030

Quantitative characterization of silica nanoparticles by asymmetric flow FFF‑MALS‑ICP‑QQQ using the Agilent 8800 ICP‑QQQ

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Low-level speciated analysis of Cr(III) and Cr(VI) using LC(IC)-ICP-MS

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

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