Applications focused on ICP/MS - page 89

WCPS: Application of Collision/Reaction Cell ICP-MS to the Analysis of Variable and Unknown Samples

Posters

| 2004 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture

Determination of Mercury in Microwave Digests of Foodstuffs by ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies, CEM

Industries

Food & Agriculture

Analysis of Electroceramics by Laser Ablation ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

A New Technique for the Analysis of Corundum Using Laser Ablation ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Environmental

Introduction to Laser Ablation ICP-MS for the Analysis of Forensic Samples

Technical notes

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Detection of Toxic Industrial Compounds: A Guide to Analytical Techniques

Guides

| 2003 | Agilent Technologies

GC/MSD, GC/SQ, LC/MS, LC/SQ, ICP/MS

Instrumentation

GC/MSD, GC/SQ, LC/MS, LC/SQ, ICP/MS

Manufacturer

Agilent Technologies

Industries

Homeland Security

Quantification and Characterization of Sulfur in Low-Sulfur Reformulated Gasolines by GC-ICP-MS

Applications

| 2003 | Agilent Technologies

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Meeting Worldwide Regulatory Requirements for the Analysis of Trace Metals in Drinking Water Using the Agilent 7500c ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis