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Applications focused on ICP/MS - page 6

Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ

Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Automating EPA 6020 Compliant Analysis with the Agilent 7900 ICP-MS and ESI prepFAST Autodilution System

Applications
| 2017 | Agilent Technologies
Sample Preparation, ICP/MS
Instrumentation
Sample Preparation, ICP/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental

WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

GCC: Best practices for the analyses of complex samples by ICP-OES and ICP-MS: Streamline workflow for accurate results

Presentations
| 2022 | Thermo Fisher Scientific
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Agilent 8800 ICP-QQQ Upgrades

Others
| 2024 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries

WCPS: Determination of Geographical Origin of Rice by ICP-MS with Helium Collision-Reaction Cell

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra High Matrix Introduction (UHMI)

Technical notes
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike