Applications focused on ICP/MS | LabRulez ICPMS

Determining Elemental Impurities in Pharmaceutical Ingredients using ICP-MS

Applications

| 2021 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

A Comparison of GC-ICP-MS and HPLC-ICP-MS for the Analysis of Organotin Compounds

Applications

| 2002 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis

Manufacturer

ELGA LabWater, Agilent Technologies

Industries

Environmental

ANALYSIS OF TRACE LEVEL OF HEAVY METALS IN NOODLES AND FLAVOR SACHET USING THE AGILENT 7900 ICP-MS

Applications

| 2016 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Automated Analysis of Ultratrace Elemental Impurities in Isopropyl Alcohol

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of P, Si and S in acid digested lubricating oil using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2014 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Multi-element analysis of crude oil samples by ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode

Applications

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications focused on ICP/MS | LabRulez ICPMS

Determining Elemental Impurities in Pharmaceutical Ingredients using ICP-MS

A Comparison of GC-ICP-MS and HPLC-ICP-MS for the Analysis of Organotin Compounds

ANALYSIS OF TRACE LEVEL OF HEAVY METALS IN NOODLES AND FLAVOR SACHET USING THE AGILENT 7900 ICP-MS

Automated Analysis of Ultratrace Elemental Impurities in Isopropyl Alcohol

Determination of P, Si and S in acid digested lubricating oil using the Agilent 8800 Triple Quadrupole ICP-MS

Multi-element analysis of crude oil samples by ICP-MS

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode

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