Applications focused on UV–VIS spectrophotometry from Agilent Technologies | LabRulez ICPMS

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

VW Absolute Specular Reflectance Accessory

Brochures and specifications

| 2021 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Agilent Cary 4000/5000/6000i Series UV-VIS-NIR Spectrophotometers

Brochures and specifications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Extended Sample Compartment

Brochures and specifications

| 2021 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Applications focused on UV–VIS spectrophotometry from Agilent Technologies | LabRulez ICPMS

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

VW Absolute Specular Reflectance Accessory

The determination of thin film thickness using reflectance spectroscopy

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Low reflectance measurements using the ‘VW’ technique

Agilent Cary 4000/5000/6000i Series UV-VIS-NIR Spectrophotometers

Extended Sample Compartment

Optical Characterization of Materials Using Spectroscopy

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