Applications focused on NIR Spectroscopy - page 1

Measurement of Diffuse Reflection from Catalyst Powders

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Moving from System II to Metrohm NIR Systems Analyzers

Brochures and specifications

| 2015 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Data and method transfer from System II analyzer to Metrohm NIRS XDS or DS 2500 analyzers

Technical notes

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Towards a generic procedure for the detection of relevant contaminants from waste electric and electronic equipment (WEEE) in plastic food-contact materials: practical aspects

Posters

| 2017 | Shimadzu (RAFA)

GC/MSD, Thermal desorption, Pyrolysis, NIR Spectroscopy, ICP-OES

Instrumentation

GC/MSD, Thermal desorption, Pyrolysis, NIR Spectroscopy, ICP-OES

Manufacturer

Shimadzu

Industries

Food & Agriculture

Analytical method transfer

Technical notes

| 2018 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Analytical data transfer between a Fourier transform and a dispersive NIR instrument

Technical notes

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Cobalt content, solids content, specific gravity, and viscosity in cobalt octoate

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Identification of a pharmaceutical tablet’s origin using FT Near-IR and Principal Component Analysis

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, FTIR Spectroscopy

Instrumentation

NIR Spectroscopy, FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

Reflectance Measurements of an Apple and Pear, and Prediction of Elapsed Days by Multivariate Analysis

Applications

| 2013 | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Food & Agriculture