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Applications focused on NIR Spectroscopy - page 1

Low reflectance measurements using the ‘VW’ technique

Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Applications
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Identification of a pharmaceutical tablet’s origin using FT Near-IR and Principal Component Analysis

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, FTIR Spectroscopy
Instrumentation
NIR Spectroscopy, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

The measurement of moisture content in mineral ore samples

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental

Gaining Deeper Insights into Thin Film Response

Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Molecular Spectroscopy Application eHandbook

Guides
| 2017 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing

Optical Characterization of Materials Using Spectroscopy

Guides
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
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