Applications from the field of Materials Testing | LabRulez ICPMS

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring optical filters

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Verifying Raw Materials by Spatially Offset Raman Spectroscopy

Technical notes

| 2018 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measurement of Degree of Crystallinity of Cellulose Nanofiber

Applications

| 2018 | Shimadzu

XRD

Instrumentation

XRD

Manufacturer

Shimadzu

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Improving Battery Production Yield, Performance, and Stability Using FTIR

Applications

| 2024 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

The determination of thin film thickness using reflectance spectroscopy

Measuring optical filters

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Verifying Raw Materials by Spatially Offset Raman Spectroscopy

Measurement of Degree of Crystallinity of Cellulose Nanofiber

Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Improving Battery Production Yield, Performance, and Stability Using FTIR

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