Applications from the field of Materials Testing | LabRulez ICPMS

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Gaining Deeper Insights into Thin Film Response

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Investigation of Dichroism by Spectrophotometric Methods

Applications

| 2019 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

IDENTIFYING NATURAL GEMS FROM SYNTHETIC AND TREATED COUNTERPARTS USING THE AGILENT CARY 660

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Laser Ablation (LA)-ICP-MS for Production Control of Nickel Alloys

Applications

| 2005 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Materials Testing

Pros and Cons of Using Correlation versus Multivariate Algorithms for Material Identification via Handheld Spectroscopy

Technical notes

| 2019 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Applications from the field of Materials Testing | LabRulez ICPMS

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

The deep ultraviolet spectroscopic properties of a next-generation photoresist

The determination of thin film thickness using reflectance spectroscopy

Gaining Deeper Insights into Thin Film Response

Investigation of Dichroism by Spectrophotometric Methods

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

IDENTIFYING NATURAL GEMS FROM SYNTHETIC AND TREATED COUNTERPARTS USING THE AGILENT CARY 660

Laser Ablation (LA)-ICP-MS for Production Control of Nickel Alloys

Pros and Cons of Using Correlation versus Multivariate Algorithms for Material Identification via Handheld Spectroscopy

Optical Characterization of Materials Using Spectroscopy

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