Applications from the field of Materials Testing | LabRulez ICPMS
Positive Material Identification: Qualification, Composition Verification and Counterfeit Detection of Polymeric Material using Mobile FTIR Spectrometers
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
EDXRF Analysis of Incinerated Ash
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Mix Ratio Identification in Industrially Significant Two-Part Coating Systems Using the Agilent 4300 Handheld FTIR
Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
High-Speed X-Ray Diffraction Analysis of Asbestos (Chrysotile) Using Wide-Range High-Speed Detector "OneSight"
Applications
| 2014 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Materials Testing
Introduction of Quantitative Analysis of Aluminum Alloys and Matching Function
Applications
| 2022 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Multifaceted Evaluation of Gemstones Using UV-Vis and EDXRF
Applications
| 2023 | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample
Applications
| 2021 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
On-site detection of hexavalent chromium in protective paint primers
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
EDXRF and WDXRF Analysis of Cd
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Quantitative characterization of silica nanoparticles by asymmetric flow FFF‑MALS‑ICP‑QQQ using the Agilent 8800 ICP‑QQQ