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    Applications from the field of Materials Testing | LabRulez ICPMS

    Quantification Of Decabromodiphenyl Ether In Microplastics Using Direct Insert Probe Coupled With Magnetic Sector High Resolution Mass Spectrometer In Full Scan Mode

    Posters
    | 2019 | Thermo Fisher Scientific (RAFA)
    GC/MSD, GC/HRMS, DART
    Instrumentation
    GC/MSD, GC/HRMS, DART
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Materials Testing

    Analyzing UV-328 and Dechlorane Plus in Plastic by Pyrolyzer/Thermal Desorption-GC-MS

    Applications
    | 2023 | Shimadzu
    GC/MSD, Pyrolysis, GC/SQ
    Instrumentation
    GC/MSD, Pyrolysis, GC/SQ
    Manufacturer
    Shimadzu, Frontier Lab
    Industries
    Materials Testing

    Analysis of Low-level Polycyclic Aromatic Hydrocarbons (PAHs) in Rubber and Plastic Articles Using Agilent J&W DB-EUPAH GC column

    Applications
    | 2010 | Agilent Technologies
    GC/MSD, GC/SQ, GC columns, Consumables
    Instrumentation
    GC/MSD, GC/SQ, GC columns, Consumables
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Graphene Raman Analyzer: Carbon Nanomaterials Characterization

    Technical notes
    | 2017 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Materials Testing

    Method Development for a Simple and Reliable Determination of PCBs in Mineral Insulating Oil by SPME-GC-ECD

    Applications
    | 2013 | Thermo Fisher Scientific
    GC, SPME
    Instrumentation
    GC, SPME
    Manufacturer
    Thermo Fisher Scientific
    Industries
    Materials Testing

    AccuTOF GC series Applications Notebook

    Applications
    | 2016 | JEOL
    GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
    Instrumentation
    GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
    Manufacturer
    Agilent Technologies, JEOL
    Industries
    Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Others
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