Applications from the field of Materials Testing | LabRulez ICPMS

Method Development for a Simple and Reliable Determination of PCBs in Mineral Insulating Oil by SPME-GC-ECD

Applications

| 2013 | Thermo Fisher Scientific

GC, SPME

Instrumentation

GC, SPME

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Comparison of Standard Liquid Extraction and Direct Thermal Desorption GC/MS Techniques for the Analysis of Charcoal Filters used for Indoor Air Purification in a PCB Contaminated Building

Applications

| 1996 | GERSTEL

GC/MSD, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, Thermal desorption, GC/SQ

Manufacturer

Agilent Technologies, GERSTEL

Industries

Environmental, Materials Testing

Product Catalogue ALS EUROPE (WASTE)

Brochures and specifications

| N/A | ALS Europe

GC, GC/MSD, GC/HRMS, ICP/OES, Electrochemistry

Instrumentation

GC, GC/MSD, GC/HRMS, ICP/OES, Electrochemistry

Manufacturer

Industries

Environmental, Energy & Chemicals , Materials Testing, Others

Characterization of Fluoropolymers Using FTIR and TG-DTA to Support the Growth of 5G

Applications

| 2023 | Shimadzu

FTIR Spectroscopy, Thermal Analysis

Instrumentation

FTIR Spectroscopy, Thermal Analysis

Manufacturer

Shimadzu

Industries

Materials Testing

Fast GC PAH Analysis by ZB-PAH-EU and ZB-PAH-SeleCT

Brochures and specifications

| 2020 | Phenomenex

GC columns, Consumables

Instrumentation

GC columns, Consumables

Manufacturer

Phenomenex

Industries

Environmental, Food & Agriculture, Materials Testing

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Analysis of Volatiles from Printed Circuit Boards

Applications

| N/A | CDS Analytical

GC/MSD, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, Thermal desorption, GC/SQ

Manufacturer

Agilent Technologies, CDS Analytical

Industries

Materials Testing

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes

Technical notes

| 2004 | Agilent Technologies

GC/MSD

Instrumentation

GC/MSD

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Method Development for a Simple and Reliable Determination of PCBs in Mineral Insulating Oil by SPME-GC-ECD

Comparison of Standard Liquid Extraction and Direct Thermal Desorption GC/MS Techniques for the Analysis of Charcoal Filters used for Indoor Air Purification in a PCB Contaminated Building

Product Catalogue ALS EUROPE (WASTE)

Characterization of Fluoropolymers Using FTIR and TG-DTA to Support the Growth of 5G

Fast GC PAH Analysis by ZB-PAH-EU and ZB-PAH-SeleCT

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Analysis of Volatiles from Printed Circuit Boards

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes

High Temperature Dehydration Studies Using UV-Vis-NIR Diffuse Reflectance Spectroscopy

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