Applications from the field of Materials Testing | LabRulez ICPMS

Analysis of Minute Objects Using the SurveyIR Sample Compartment Type Infrared Microscopy System

Applications

| 2023 | Shimadzu

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Shimadzu

Industries

Materials Testing

Introducing the XSeeker 8000 Bench-Top X-Ray CT System

Technical notes

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

EDX-7200 New Primary Filter - Quantitative Analysis of Titanium Dioxide in Antibacterial Coatings

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Metrohm STRam portable Raman spectrometer

Brochures and specifications

| 2020 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Energy & Chemicals , Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Quantitative Analysis of Antimony (Sb) in Plastics by EDXRF

Applications

| 2012 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Analysis of Minute Objects Using the SurveyIR Sample Compartment Type Infrared Microscopy System

Introducing the XSeeker 8000 Bench-Top X-Ray CT System

EDX-7200 New Primary Filter - Quantitative Analysis of Titanium Dioxide in Antibacterial Coatings

Metrohm STRam portable Raman spectrometer

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Quantitative Analysis of Antimony (Sb) in Plastics by EDXRF

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

The determination of thin film thickness using reflectance spectroscopy

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