Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Determination of Elemental Impurities in Graphite-based Anodes using the Agilent 5110 ICP-OES
Applications
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
Analysis of Elemental Impurities in Lithium Iron Phosphate Cathode Materials for LIBs by ICP-OES