Applications from the field of Materials Testing - page 1

Performance Features of an Extended Range Beamsplitter for Mid- and Near-IR Spectroscopy

Applications

| 2008 | Thermo Fisher Scientific

FTIR Spectroscopy, NIR Spectroscopy, RAMAN Spectroscopy

Instrumentation

FTIR Spectroscopy, NIR Spectroscopy, RAMAN Spectroscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

INVENIO Analytical FT-IR Toolbox

Brochures and specifications

| 2022 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing

Confocal Raman Microscopy Applications in the Polymer Industry

Applications

| 2008 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Advancing Research of Lithium-Ion Batteries Using the Agilent Cary 630 FTIR Spectrometer

Applications

| 2023 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Solutions for Plastic Evaluation

Guides

| 2013 | Shimadzu

Thermal Analysis, GC/SQ, LC/SQ, LC/MS, LC/TOF, GC/MSD, MALDI, GC, HeadSpace, HPLC, LC/IT, Mechanical testing

Instrumentation

Thermal Analysis, GC/SQ, LC/SQ, LC/MS, LC/TOF, GC/MSD, MALDI, GC, HeadSpace, HPLC, LC/IT, Mechanical testing

Manufacturer

Shimadzu

Industries

Materials Testing

Practical Applications of Surface-Enhanced Raman Scattering (SERS)

Applications

| 2010 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Mix Ratio Identification in Industrially Significant Two-Part Coating Systems Using the Agilent 4300 Handheld FTIR

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

Handheld Raman Analyzers for Rapid Identification of Suspicious Materials

Others

| 2019 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Comparison of SPELEC RAMAN and standard Raman microscopes

Applications

| 2024 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing