Applications from the field of Materials Testing | LabRulez ICPMS

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Agilent ICP-MS Journal (May 2005 – Issue 23)

Others

| 2005 | Agilent Technologies

ICP/MS, Speciation analysis

Instrumentation

ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Agilent ICP-MS Journal (October 2013 – Issue 55)

Others

| 2013 | Agilent Technologies

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing, Clinical Research

WCPS: Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ

Posters

| 2017 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Materials Testing

Analysis of Elemental Impurities in Lithium-Ion Battery Electrolyte Solvents by ICP-MS

Applications

| 2023 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

Applications

| 2015 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS

Posters

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Agilent ICP-MS Journal (May 2005 – Issue 23)

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Agilent ICP-MS Journal (October 2013 – Issue 55)

WCPS: Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ

Analysis of Elemental Impurities in Lithium-Ion Battery Electrolyte Solvents by ICP-MS

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

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