Applications from the field of Materials Testing | LabRulez ICPMS

Quantitative Analysis of Lead in Bismuth Bronze - Matrix Elements/Profile Correction and Comparison with AA

Applications

| 2017 | Shimadzu

AAS, X-ray

Instrumentation

AAS, X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Applications

| 2018 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Inspection of Defects in an Automotive Inverter Component with X-Ray Inspection System

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

Applications

| 2012 | Shimadzu

AAS, MP/ICP-AES, X-ray

Instrumentation

AAS, MP/ICP-AES, X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Lead in lead-free solder – EDX-720

Others

| 2006 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Vis-NIR spectroscopic analysis of wood pulps for multiparameter prediction

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Fast, Accurate, Robust Analysis of Multiple Elements in Steel by ICP-OES

Applications

| 2022 | Agilent Technologies

ICP/OES

Instrumentation

ICP/OES

Manufacturer

Agilent Technologies

Industries

Materials Testing

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Analysis of copolymer levels in polymer pellets by near-infrared spectroscopy

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Multilayer Film Analysis Using the AIMsight Infrared Microscope

Applications

| 2023 | Shimadzu

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Shimadzu

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Quantitative Analysis of Lead in Bismuth Bronze - Matrix Elements/Profile Correction and Comparison with AA

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Inspection of Defects in an Automotive Inverter Component with X-Ray Inspection System

Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

Lead in lead-free solder – EDX-720

Vis-NIR spectroscopic analysis of wood pulps for multiparameter prediction

Fast, Accurate, Robust Analysis of Multiple Elements in Steel by ICP-OES

Instruments for Analyzing / Evaluating Electronic Device

Analysis of copolymer levels in polymer pellets by near-infrared spectroscopy

Multilayer Film Analysis Using the AIMsight Infrared Microscope

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