Applications from the field of Materials Testing | LabRulez ICPMS

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Technical notes

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The Measurement of High Optical Densities in the Near-Infrared

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Investigating the Angular Dependence of Absolute Specular Reflection

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Raman Spectroscopy for Quick Quality Analysis of Diamond Membranes

Applications

| 2008 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

The Measurement of High Optical Densities in the Near-Infrared

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Investigating the Angular Dependence of Absolute Specular Reflection

Raman Spectroscopy for Quick Quality Analysis of Diamond Membranes

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