Applications from the field of Materials Testing | LabRulez ICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Gaining Deeper Insights into Thin Film Response

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials

Applications

| 2021 | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Applications

| N/A | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Applications

| N/A | Shimadzu

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Unattended, Automated Measurements of Optical Components in a Production Environment

Technical notes

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Gaining Deeper Insights into Thin Film Response

Optical Characterization of Materials Using Spectroscopy

LiDAR Evaluation System: Measurement of Transmittance/Reflectance of Optical Materials

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Optical Characterization of Thin Films

Detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700

Unattended, Automated Measurements of Optical Components in a Production Environment

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