Applications from the field of Materials Testing | LabRulez ICPMS

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Nondestructive Elemental Analysis of Historical Materials (Old Metal Specimens) by X-Ray Fluorescence Spectrometer

Applications

| 2021 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

ANALYSIS OF EXTRACTABLE AND LEACHABLE METALS IN PLASTIC MATERIALS OF CONSTRUCTION AS PER USP <661.1> ACID EXTRACTION PROCEDURE USING THE AGILENT 5110 VDV ICP-OES

Applications

| 2016 | Agilent Technologies

LC/Orbitrap, ICP/OES

Instrumentation

LC/Orbitrap, ICP/OES

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quantitative Analysis of Tin (Sn) in Plastics by EDXRF

Applications

| 2013 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Tin in Resin Analysis Using EDX - Sn Screening Analysis Kit

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

RoHS Screening Analysis by EDX

Applications

| 2022 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Determination of Trivalent and Hexavalent Chromium in Toy Materials

Applications

| 2021 | Agilent Technologies

HPLC, ICP/MS, Speciation analysis

Instrumentation

HPLC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

Applications

| 2012 | Shimadzu

AAS, MP/ICP-AES, X-ray

Instrumentation

AAS, MP/ICP-AES, X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Nondestructive Elemental Analysis of Historical Materials (Old Metal Specimens) by X-Ray Fluorescence Spectrometer

ANALYSIS OF EXTRACTABLE AND LEACHABLE METALS IN PLASTIC MATERIALS OF CONSTRUCTION AS PER USP <661.1> ACID EXTRACTION PROCEDURE USING THE AGILENT 5110 VDV ICP-OES

Quantitative Analysis of Tin (Sn) in Plastics by EDXRF

Tin in Resin Analysis Using EDX - Sn Screening Analysis Kit

RoHS Screening Analysis by EDX

Determination of Trivalent and Hexavalent Chromium in Toy Materials

Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

Spectrophotometric Spatial Profiling of Coated Optical Wafers

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