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Applications from the field of Materials Testing - page 81

Pseudo Elements: Use, Format, Example, Explanation & Discussion

Technical notes
| 2008 | LECO
GD/MP/ICP-AES, Elemental Analysis, Software
Instrumentation
GD/MP/ICP-AES, Elemental Analysis, Software
Manufacturer
LECO
Industries
Materials Testing

Surface Carbon on Steel Sheet and Rod Samples

Applications
| 2008 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Hydrogen Determination in Reactive and Refractory Metals*

Applications
| 2008 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Confocal Raman Microscopy Applications in the Polymer Industry

Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Use of the DXR Raman Microscope to Generate a Micron-Level Map of an Amethyst Sample

Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Confocal Raman Microscopy Analysis of Multilayer Polymer Films

Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy, Software
Instrumentation
RAMAN Spectroscopy, Microscopy, Software
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Measuring Diamond-like Carbon Films by Dispersive Raman Spectroscopy

Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

The DXR Raman Microscope for High-Performance Raman Microscopy

Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy, Software
Instrumentation
RAMAN Spectroscopy, Microscopy, Software
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

The Merits of Quantitative Element Mapping at Low Acceleration Voltage and High Magnification

Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability

Brochures and specifications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
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GCMS
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