Applications from the field of Materials Testing - page 76

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Rapid Analysis of Minerals Using the Agilent Cary 630 FTIR With Diamond ATR

Others

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

HTK 1200N High-Temperature Oven Chamber

Brochures and specifications

| 2014 | Anton Paar

X-ray

Instrumentation

X-ray

Manufacturer

Anton Paar

Industries

Materials Testing

HTK 1200N Capillary Extension

Brochures and specifications

| 2014 | Anton Paar

X-ray, Consumables

Instrumentation

X-ray, Consumables

Manufacturer

Anton Paar

Industries

Materials Testing

HTK 16N/HTK 2000N High-Temperature Chambers

Brochures and specifications

| 2014 | Anton Paar

Consumables, XRD

Instrumentation

Consumables, XRD

Manufacturer

Anton Paar

Industries

Materials Testing

Oxygen and Hydrogen Determination in Titanium Hydride (TCH600)

Applications

| 2014 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Energy & Chemicals , Materials Testing

Carbon/Nitrogen in Coal, Coke, Carbon Black, and Graphite

Applications

| 2014 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Energy & Chemicals , Materials Testing

Carbon in Refractory and Reactive Metals

Applications

| 2014 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Energy & Chemicals , Materials Testing

Carbon and Sulfur in Lime (CS744)

Applications

| 2014 | LECO

Elemental Analysis, Thermal Analysis

Instrumentation

Elemental Analysis, Thermal Analysis

Manufacturer

LECO

Industries

Materials Testing

Cleaning Metal Oxides Using Argon Cluster Ions to Prevent Surface Modification

Applications

| 2014 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Energy & Chemicals