Applications from the field of Materials Testing - page 31

Failure Analysis of Paper: Determination of the Chemical Identity of Impurities and Inclusions

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Bruker
Industries
Materials Testing

XRD investigation of three types of polyethylene films with ARL EQUINOX 100 X-ray Diffractometer

Applications
| 2019 | Thermo Fisher Scientific
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Single particle analysis of nanomaterials with agilent ICP-MS

Posters
| N/A | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing

High Precision Analysis of Major Components in Precious Metals by ICP-OES

Applications
| 2025 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Materials Testing

Accurate Determination of TiO2 Nanoparticles in Complex Matrices using the Agilent 8900 ICP-QQQ

Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Materials Testing

Positive Material Identification: Qualification, Composition Verification and Counterfeit Detection of Polymeric Material using Mobile FTIR Spectrometers

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing

Molecular Spectroscopy Application eHandbook

Guides
| 2017 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing

Improving Spectral Quality Using Beam Collimation Control

Technical notes
| 2024 | Agilent Technologies
UV–VIS spectrophotometry, NIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Lead in lead-free solder – EDX-720

Others
| 2006 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Other projects
GCMS
LCMS
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