Applications from the field of Materials Testing - page 3
Advancing Research of Lithium-Ion Batteries Using the Agilent Cary 630 FTIR Spectrometer
Applications
| 2023 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Positive Material Identification: Qualification, Composition Verification and Counterfeit Detection of Polymeric Material using Mobile FTIR Spectrometers
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of plastics and polymers for RoHS/WEE compliance by EDXRF
Applications
| 2024 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Cosmetic Raw Material Identification Testing Through Transparent and Opaque Containers
Applications
| 2024 | Agilent Technologies
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Multi-technique surface analysis for structural and chemical characterization of 2D materials
Applications
| 2020 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
INVENIO R intuitive FTIR R&D Spectrometer
Brochures and specifications
| 2018 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing
QuAntItAtIve determInAtIon of common types of Asbestos by dIffuse reflectAnce ftIr usIng the AgIlent cAry 630 spectrometer
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Hydrogen and Chemical Quantification of an Organic Coating
Applications
| 2016 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS