Applications from the field of Materials Testing - page 20

Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer

Applications

| 2016 | Agilent Technologies

GD/MP/ICP-AES

Instrumentation

GD/MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Materials Testing

Using the UV-2600i Plus and ISR-2600Plus to Perform UV-Vis-NIR Measurements on Various Types of Glass

Applications

| 2025 | Shimadzu

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Materials Testing

Analysis of polymer granulate by near-infrared spectroscopy

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Improving Resolution of Single Nanoparticles Using ICP-MS and Shorter Dwell Times

Technical notes

| 2026 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measurement of Diffuse Reflection from Catalyst Powders

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Vis-NIR spectroscopic analysis of wood pulps for multiparameter prediction

Applications

| N/A | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Analysis of Nitrogen in Low Alloy Steel

Applications

| N/A | Shimadzu

Optical Emission Spectroscopy (OES)

Instrumentation

Optical Emission Spectroscopy (OES)

Manufacturer

Shimadzu

Industries

Materials Testing

Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Measurement of Bidirectional Transmittance Distribution Function

Applications

| 2025 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing