Applications from the field of Materials Testing - page 2

Carbon and Sulfur Determination in High Carbon Ferroalloys

Applications

| 2013 | LECO

Elemental Analysis, Thermal Analysis

Instrumentation

Elemental Analysis, Thermal Analysis

Manufacturer

LECO

Industries

Materials Testing

DIC Analysis in High-Speed Tensile Test of CFRP

Applications

| 2026 | Shimadzu

Laboratory instruments

Instrumentation

Laboratory instruments

Manufacturer

Shimadzu

Industries

Materials Testing

Carbon and Sulfur Determination in High Carbon Ferroalloys - CS744

Applications

| 2019 | LECO

Elemental Analysis, Thermal Analysis

Instrumentation

Elemental Analysis, Thermal Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Carbon and Sulfur Determination in High Carbon Ferroalloys (CS844)

Applications

| 2019 | LECO

Elemental Analysis, Thermal Analysis

Instrumentation

Elemental Analysis, Thermal Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

The DXR Raman Microscope for High-Performance Raman Microscopy

Applications

| 2008 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy, Software

Instrumentation

RAMAN Spectroscopy, Microscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Put high performance to work for you - DXR3 Raman Microscope

Brochures and specifications

| 2023 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Carbon Analysis with High Signal Throughput Portable Raman Spectroscopy

Technical notes

| N/A | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

Bulk Analysis of High-Speed and Cold-Working Tool Steel

Applications

| 2019 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

High-Speed Residual Stress Measurement by X-Ray Diffraction (Linear Guide)

Applications

| 2019 | Shimadzu

XRD

Instrumentation

XRD

Manufacturer

Shimadzu

Industries

Materials Testing

Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing