Applications from the field of Materials Testing - page 14
Analysis of ilmenite ore samples from Australia and China with ARL EQUINOX 100 XRD & ARL QUANT'X XRF instruments
Applications
| 2018 | Thermo Fisher Scientific
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
XRD and XRF investigation of Martian analog basalt from terrestrial craters
Applications
| 2018 | Thermo Fisher Scientific
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Determination of Oxygen and Nitrogen in Graphite and Calcined Coke
Applications
| 2016 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Sulfur in Battery Paste (PbO/PbSO4)
Applications
| 2010 | LECO
Elemental Analysis, Thermal Analysis
Instrumentation
Elemental Analysis, Thermal Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Sulfur in Copper Base Materials
Applications
| 2010 | LECO
Elemental Analysis, Thermal Analysis
Instrumentation
Elemental Analysis, Thermal Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
INVENIO Analytical FT-IR Toolbox
Brochures and specifications
| 2022 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing
Determination of Oxygen, Nitrogen, and Hydrogen in Iron, Steel, Nickel-base, and Cobalt-base Alloys: Comparison of Analytical Performance Between Argon and Helium Carrier
Applications
| 2020 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
The Migration of Elements from Toys and Speciation of Chromium (VI) in Toy Material Using a Low Cost IC-ICP-MS Solution
Applications
| 2016 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode