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Applications from the field of Materials Testing from Thermo Fisher Scientific - page 30
Analysis of As, P dopant distribution of NMOS transistor by FESTEM & EDS
Applications
| 2009 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Calibrationless Semi-Quantitative Analysis of a Heterogeneous Sample Using Raman Microscope Mapping
Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Pharma & Biopharma
Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy
Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
Raman Mapping of Single-walled Carbon Nanotube Distribution on Phase Separated Polystyrene and Polymethylmethacrylate
Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Rapid Screening of Semiprecious Gemstones by Raman Spectroscopy
Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Mining Exploration and Geochemical Analysis of Mining Samples
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Materials Testing, Environmental
On-site Elemental Analysis of Art and Artifacts
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Analysing AF Elements
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals , Environmental
The Merits of Quantitative Element Mapping at Low Acceleration Voltage and High Magnification
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Errors Associated With Thin Film Measurements Using XPS at a Single Angle
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike