Applications from the field of Materials Testing focused on GD/MP/ICP-AES - page 1
Analysis of Br in Plastic by ICP-AES
Applications
| N/A | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX
Applications
| 2012 | Shimadzu
AAS, GD/MP/ICP-AES, X-ray
Instrumentation
AAS, GD/MP/ICP-AES, X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Analysis of Plastic
Applications
| N/A | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Analysis of Elemental Impurities in Anode Materials for Lithium-Ion Secondary Batteries Using the ICPE- 9820
Applications
| 2024 | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Quantitative Depth Profile (QDP) Analysis of NIST 2135c - Ni/Cr Thin Film Depth Profile Standard
Applications
| 2010 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
Simultaneous Analysis of Trace and Major Elements in Iron and Steel by ICPE-9820
Applications
| 2014 | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Precision Analysis of Toxic Elements in Plastic by ICPE-9800 Series
Applications
| 2014 | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing
Compositional Depth Profiling of Hard Disks with Glow Discharge Atomic Emission Spectrometry (GD-AES)
Applications
| 2016 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
WCPS: Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 MP-AES