Applications from the field of Semiconductor Analysis | LabRulez ICPMS

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Analysis of OLEDs by Laser Desorption Ionization Using a Novel Imaging Mass Microscope

Posters

| 2022 | Shimadzu (ASMS)

MS Imaging, LC/MS

Instrumentation

MS Imaging, LC/MS

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (October 2020, Issue 82)

Others

| 2020 | Agilent Technologies

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others

| 2021 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Instrumentation

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Metrohm, CEM

Industries

Environmental, Food & Agriculture, Semiconductor Analysis

Semiconductor workflows - Trace contaminant analysis application compendium

Guides

| 2023 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

Determination of trace anions in hydrofluoric acid, ammonium fluoride, and a buffered oxide etchant

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Ion Analysis with Agilent Capillary Electrophoresis Systems

Guides

| 2010 | Agilent Technologies

Capillary electrophoresis

Instrumentation

Capillary electrophoresis

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Semiconductor Analysis

Applications from the field of Semiconductor Analysis | LabRulez ICPMS

Instruments for Analyzing / Evaluating Electronic Device

Analysis of OLEDs by Laser Desorption Ionization Using a Novel Imaging Mass Microscope

Agilent ICP-MS Journal (October 2020, Issue 82)

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Optical Characterization of Materials Using Spectroscopy

Agilent ICP-MS Journal (November 2021, Issue 86)

Semiconductor workflows - Trace contaminant analysis application compendium

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Determination of trace anions in hydrofluoric acid, ammonium fluoride, and a buffered oxide etchant

Ion Analysis with Agilent Capillary Electrophoresis Systems

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