Applications from the field of Semiconductor Analysis - page 1

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others

| 2021 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Instrumentation

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Metrohm, CEM

Industries

Environmental, Food & Agriculture, Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Workflow for Migrating OLED Impurity Profiling from R&D to QC Setting with Solvent Compatible Mass Detector System

Technical notes

| 2019 | Waters

LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ

Instrumentation

LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ

Manufacturer

Waters

Industries

Materials Testing, Semiconductor Analysis

Agilent ICP-MS Journal (October 2020, Issue 82)

Others

| 2020 | Agilent Technologies

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Comprehensive Analysis of Oligomeric Impurities, Monomer Composition, and End-Group Information in ArFPhotoresist Block Copolymers Using Q-TOF High-Resolution Mass Spectrometry

Posters

| 2025 | Agilent Technologies (ASMS)

LC/MS, LC/MS/MS, LC/TOF, LC/HRMS

Instrumentation

LC/MS, LC/MS/MS, LC/TOF, LC/HRMS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Quantitative Analysis of Legacy & Emerging PFAS in Semiconductor Lubricant using Triple Quadrupole LC/MS

Posters

| 2024 | Agilent Technologies (ASMS)

LC/MS/MS, LC/MS, LC/QQQ

Instrumentation

LC/MS/MS, LC/MS, LC/QQQ

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Ion Analysis with Agilent Capillary Electrophoresis Systems

Guides

| 2010 | Agilent Technologies

Capillary electrophoresis

Instrumentation

Capillary electrophoresis

Manufacturer

Agilent Technologies

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Semiconductor Analysis