Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
Applications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Detection of molecular ions from OLED material using AccuTOF GC
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR
Applications
| 2018 | Shimadzu
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Materials Testing, Semiconductor Analysis
SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES
Brochures and specifications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Infrared Photoluminescence Spectroscopy
Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing, Semiconductor Analysis
Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature
Applications
| 2026 | Shimadzu
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Carbon and Oxygen Quantification in Silicon wafers