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    Applications from the field of Semiconductor Analysis | LabRulez ICPMS

    Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

    Applications
    | 2021 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

    Technical notes
    | 2010 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

    Posters
    | 2020 | Agilent Technologies (ASMS)
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2013 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent ICP-MS Journal (July 2017 – Issue 69)

    Others
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Pharma & Biopharma, Semiconductor Analysis

    Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent ICP-MS Journal (November 2021, Issue 86)

    Others
    | 2021 | Agilent Technologies
    Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
    Instrumentation
    Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies, Metrohm, CEM
    Industries
    Environmental, Food & Agriculture, Semiconductor Analysis

    Agilent ICP-MS Journal (March 2012 – Issue 49)

    Others
    | 2012 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis
     

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