Applications from the field of Semiconductor Analysis - page 1

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Agilent ICP-MS Journal (April 2018. Issue 72)

Others

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture, Semiconductor Analysis

Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS

Applications

| 2004 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides

| 2020 | Agilent Technologies

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Instrumentation

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others

| 2021 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Instrumentation

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Metrohm, CEM

Industries

Environmental, Food & Agriculture, Semiconductor Analysis

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Cross-Sectional Analysis of Power Semiconductor and Silver Sintering Die Attach Material

Applications

| 2025 | Shimadzu

Microscopy

Instrumentation

Microscopy

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Consumable Solutions for Semiconductor Analysis

Brochures and specifications

| 2025 | Agilent Technologies

ICP/MS/MS, ICP/MS

Instrumentation

ICP/MS/MS, ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis