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Applications from the field of Semiconductor Analysis - page 1

Agilent ICP-MS Journal (April 2020, Issue 80)

Others
| 2020 | Agilent Technologies
Software, ICP/MS, ICP/MS/MS
Instrumentation
Software, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS

Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Pharma & Biopharma, Semiconductor Analysis

Characterization of Iron Nanoparticles in Hydrocarbon Matrices by Single Particle (sp)ICP-MS

Applications
| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others
| 2021 | Agilent Technologies
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Instrumentation
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Metrohm, CEM
Industries
Environmental, Food & Agriculture, Semiconductor Analysis

Agilent ICP-MS Journal (April 2018. Issue 72)

Others
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Semiconductor Analysis

Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS

Applications
| 2004 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike