Menu
News
News
Events
Academy - Coming soon
Library
ICPMS Library
GCMS Library
LCMS Library
Webinars
Webinars
Products
Instruments and services
Bazaar
Companies
Commercial
Non-Commercial
Medial
Career
Job offers
More information
Webinars
About us
Contact us
Terms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
News
Library
Webinars
Products
Companies
Career
News
Events
Academy - Coming soon
ICPMS Library
GCMS Library
LCMS Library
Webinars
Instruments and services
Bazaar
Commercial
Non-Commercial
Medial
Job offers
Databases
ICPMS_EN
GCMS_EN
LCMS_EN
Industries
Clinical Research
(1)
Energy & Chemicals
(9)
Environmental
(4)
Food & Agriculture
(4)
Semiconductor Analysis
Semiconductor Analysis
Instrumentation
AAS
(1)
FTIR Spectroscopy
(1)
ICP-OES
(1)
ICP/MS
(4)
Manufacturer
Agilent Technologies
(10)
CEM
(1)
Elemental Scientific
(1)
Metrohm
(5)
Author
Agilent Technologies
(10)
Metrohm
(4)
Shimadzu
(3)
Thermo Fisher Scientific
(6)
Content Type
Applications
(12)
Brochures and specifications
(1)
Guides
(4)
Others
(2)
Publication Date
Applications from the field of Semiconductor Analysis - page 1
TOC and IC Measurements for Lithium Refining Processes
Applications
| 2025 | Shimadzu
TOC, Ion chromatography
Instrumentation
TOC, Ion chromatography
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Online analysis of organic additives in copper plating process
Applications
| 2024 | Metrohm
Electrochemistry
Instrumentation
Electrochemistry
Manufacturer
Metrohm
Industries
Energy & Chemicals , Semiconductor Analysis
Semiconductor workflows - Trace contaminant analysis application compendium
Guides
| 2023 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
QUANTIFICATION OF ADDITIVES IN A COMMERCIAL CMP SAMPLE USING HPLC WITH PHOTODIODE ARRAY AND MASS DETECTION
Posters
| 2022 | Waters (HPLC Symposium)
HPLC, LC/MS, LC/SQ
Instrumentation
HPLC, LC/MS, LC/SQ
Manufacturer
Waters
Industries
Energy & Chemicals , Semiconductor Analysis
Mott-Schottky Analysis
Applications
| 2024 | Metrohm
Electrochemistry
Instrumentation
Electrochemistry
Manufacturer
Metrohm
Industries
Semiconductor Analysis
Agilent ICP-MS Journal (November 2021, Issue 86)
Others
| 2021 | Agilent Technologies
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Instrumentation
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Metrohm, CEM
Industries
Environmental, Food & Agriculture, Semiconductor Analysis
Workflow for Migrating OLED Impurity Profiling from R&D to QC Setting with Solvent Compatible Mass Detector System
Technical notes
| 2019 | Waters
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ
Instrumentation
LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ
Manufacturer
Waters
Industries
Materials Testing, Semiconductor Analysis
Ion Analysis with Agilent Capillary Electrophoresis Systems
Guides
| 2010 | Agilent Technologies
Capillary electrophoresis
Instrumentation
Capillary electrophoresis
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Semiconductor Analysis
Comprehensive Analysis of Oligomeric Impurities, Monomer Composition, and End-Group Information in ArFPhotoresist Block Copolymers Using Q-TOF High-Resolution Mass Spectrometry
Posters
| 2025 | Agilent Technologies (ASMS)
LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Instrumentation
LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Prev
1
2
...
Next
Other projects
Follow us
More information
Webinars
About us
Contact us
Terms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike