Applications from the field of Semiconductor Analysis - page 1

The power of exact mass measurement: an example of unknown compound identification

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Materials Testing, Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications

| 2009 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications

| 2026 | Metrohm

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Instrumentation

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Manufacturer

Metrohm

Industries

Semiconductor Analysis

AccuTOF GC series Applications Notebook

Applications

| 2016 | JEOL

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Instrumentation

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Applications

| 2026 | Shimadzu

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Instrumentation

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Evaluating Silicon using Raman Microscopy

Applications

| 2024 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research