Applications from the field of Semiconductor Analysis - page 1

Cross-Sectional Analysis of Power Semiconductor and Silver Sintering Die Attach Material

Applications
| 2025 | Shimadzu
Microscopy
Instrumentation
Microscopy
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Thermo Scientific ICP-MS solutions for the semiconductor industry

Brochures and specifications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Automated Analysis of Ultratrace Elemental Impurities in Isopropyl Alcohol

Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications
| 2026 | Metrohm
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Instrumentation
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Industries
Semiconductor Analysis

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

Applications
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike