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    Applications from the field of Semiconductor Analysis | LabRulez ICPMS

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES

    Brochures and specifications
    | 2017 | Syft Technologies
    SIFT-MS
    Instrumentation
    SIFT-MS
    Manufacturer
    Syft Technologies
    Industries
    Semiconductor Analysis

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Optical Characterization of Materials Using Spectroscopy

    Guides
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing, Semiconductor Analysis

    Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

    Technical notes
    | 2021 | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Semiconductor Analysis
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