Applications from the field of Semiconductor Analysis - page 1

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Carbon and Oxygen Quantification in Silicon wafers

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis

Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS

Applications

| 2017 | Syft Technologies

SIFT-MS

Instrumentation

SIFT-MS

Manufacturer

Syft Technologies

Industries

Semiconductor Analysis

Infrared Photoluminescence Spectroscopy

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing, Semiconductor Analysis

SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES

Brochures and specifications

| 2017 | Syft Technologies

SIFT-MS

Instrumentation

SIFT-MS

Manufacturer

Syft Technologies

Industries

Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

AccuTOF GC series Applications Notebook

Applications

| 2016 | JEOL

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Instrumentation

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other