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Applications from the field of Semiconductor Analysis - page 1
Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
Applications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
Applications
| 2024 | Agilent Technologies
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Thermal Desorption Analysis of Si Wafer Contaminants
Applications
| N/A | GL Sciences
GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Shimadzu, CTC Analytics, GL Sciences
Industries
Semiconductor Analysis
Detection of molecular ions from OLED material using AccuTOF GC
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples
Brochures and specifications
| 2025 | Shimadzu
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Instrumentation
GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES
Brochures and specifications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Measuring Inorganic Impurities in Semiconductor Manufacturing
Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
Brochures and specifications
| 2026 | Agilent Technologies
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
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