Applications from the field of Semiconductor Analysis - page 1

Evaluation of Surface Carbon on Lithium-Ion Battery Cathode Active Materials Using a TOC Analyzer and Infrared/Raman Microscope

Applications

| 2026 | Shimadzu

RAMAN Spectroscopy, TOC, FTIR Spectroscopy

Instrumentation

RAMAN Spectroscopy, TOC, FTIR Spectroscopy

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS

Applications

| 2017 | Syft Technologies

SIFT-MS

Instrumentation

SIFT-MS

Manufacturer

Syft Technologies

Industries

Semiconductor Analysis

Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD

Applications

| 2024 | Agilent Technologies

GC/MSD, GC/SQ

Instrumentation

GC/MSD, GC/SQ

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Thermal Desorption Analysis of Si Wafer Contaminants

Applications

| N/A | GL Sciences

GC/MSD, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, Thermal desorption, GC/SQ

Manufacturer

Shimadzu, CTC Analytics, GL Sciences

Industries

Semiconductor Analysis

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis

Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples

Brochures and specifications

| 2025 | Shimadzu

GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry

Instrumentation

GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

SEMICONDUCTOR INDUSTRY SOLUTIONS - SYFT TECHNOLOGIES

Brochures and specifications

| 2017 | Syft Technologies

SIFT-MS

Instrumentation

SIFT-MS

Manufacturer

Syft Technologies

Industries

Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

Brochures and specifications

| 2026 | Agilent Technologies

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Instrumentation

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of electrolyte components of lithium-ion batteries using gas chromatography-mass spectrometry

Applications

| 2021 | Thermo Fisher Scientific

GC/MSD, GC/SQ

Instrumentation

GC/MSD, GC/SQ

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis