Applications from the field of Semiconductor Analysis - page 1

Agilent ICP-MS Journal (April 2018. Issue 72)

Others
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Semiconductor Analysis

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Pharma & Biopharma, Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications
| 2026 | Metrohm
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Instrumentation
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS

Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others
| 2021 | Agilent Technologies
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Instrumentation
Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Metrohm, CEM
Industries
Environmental, Food & Agriculture, Semiconductor Analysis

Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (November 2022, Issue 90)

Others
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Pharma & Biopharma, Semiconductor Analysis

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Reaching sub-ppm limits of detection for carbon, nitrogen and oxygen with the Element GD Plus GD-MS

Applications
| 2023 | Thermo Fisher Scientific
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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