Applications from the field of Semiconductor Analysis - page 1

Monitoring for trace anion contamination in the extracts of electronic components

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Determination of an Anionic Fluorochemical Surfactant in a Semiconductor Etch Bath

Applications

| 1998 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Determination of trace anions in high-nitrate matrices by ion chromatography

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Determination of anions on the surface of printed circuit boards by IPC-TM-650 Method 2.3.28 using HPIC

Applications

| 2022 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

QUANTIFICATION OF ADDITIVES IN A COMMERCIAL CMP SAMPLE USING HPLC WITH PHOTODIODE ARRAY AND MASS DETECTION

Posters

| 2022 | Waters (HPLC Symposium)

HPLC, LC/MS, LC/SQ

Instrumentation

HPLC, LC/MS, LC/SQ

Manufacturer

Waters

Industries

Energy & Chemicals , Semiconductor Analysis

Automated analysis of etch acid mixtures using the 859 Titrotherm and the 814 USB Sample Processor

Applications

| N/A | Metrohm

Titration

Instrumentation

Titration

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Determination of silicate in high-purity water using ion chromatography and online sample preparation

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis