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Applications from the field of Semiconductor Analysis - page 1
Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature
Applications
| 2026 | Shimadzu
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Routine analysis of 7N high purity gallium phosphide by Glow Discharge Mass Spectrometry
Applications
| 2025 | Thermo Fisher Scientific
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
AccuTOF GC series Applications Notebook
Applications
| 2016 | JEOL
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Instrumentation
GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other
Instruments for Analyzing / Evaluating Electronic Device
Brochures and specifications
| 2022 | Shimadzu
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis
Measuring Inorganic Impurities in Semiconductor Manufacturing
Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS
Applications
| 2017 | Syft Technologies
SIFT-MS
Instrumentation
SIFT-MS
Manufacturer
Syft Technologies
Industries
Semiconductor Analysis
Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II
Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Analysis of 65 Volatile Organic Compounds in Ambient Air by Canister Sampling Using an Agilent 8890/5977 GC/MSD
Applications
| 2024 | Agilent Technologies
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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