Applications from the field of Semiconductor Analysis - page 1

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Determination of trace anions in high-nitrate matrices by ion chromatography

Applications
| 2017 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Improved determinations of residual anions and organic acids to evaluate printed circuit board cleanliness

Applications
| 2023 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Monitoring for trace anion contamination in the extracts of electronic components

Applications
| 2017 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis

Comprehensive Analysis of Oligomeric Impurities, Monomer Composition, and End-Group Information in ArFPhotoresist Block Copolymers Using Q-TOF High-Resolution Mass Spectrometry

Posters
| 2025 | Agilent Technologies (ASMS)
LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Instrumentation
LC/MS, LC/MS/MS, LC/TOF, LC/HRMS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of anions on the surface of printed circuit boards by IPC-TM-650 Method 2.3.28 using HPIC

Applications
| 2022 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Determination of halogens in polymers and electronics using a combustion ion chromatography system

Applications
| 2017 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Semiconductor Analysis

Semiconductor workflows - Trace contaminant analysis application compendium

Guides
| 2023 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Determination of trace anions in basic solutions by single pass AutoNeutralization and ion chromatography

Applications
| 2020 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike