Applications from the field of Semiconductor Analysis - page 1

Equipment Used in Semiconductor Manufacturing Processes and Evaluation Examples

Brochures and specifications

| 2025 | Shimadzu

GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry

Instrumentation

GC/MSD, TOC, LC/MS, LC/MS/MS, LC/QQQ, GC/SQ, Microscopy, FTIR Spectroscopy, X-ray, Mechanical testing, HPLC, Elemental Analysis, UV–VIS spectrophotometry

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

The power of exact mass measurement: an example of unknown compound identification

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Materials Testing, Semiconductor Analysis

Routine analysis of 7N high purity gallium phosphide by Glow Discharge Mass Spectrometry

Applications

| 2025 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Technical notes

| 2021 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Evaluating Silicon using Raman Microscopy

Applications

| 2024 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Eastern Analytical Symposium & Exposition 2022 Abstract Book

Others

| 2022 | EAS

HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, NIR Spectroscopy, Electrochemistry, LC/TOF, LC/HRMS

Instrumentation

HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, NIR Spectroscopy, Electrochemistry, LC/TOF, LC/HRMS

Manufacturer

Industries

Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Eastern Analytical Symposium & Exposition 2021 Preliminary Program

Others

| 2021 | EAS

HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis

Instrumentation

HPLC, Consumables, LC columns, NMR, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, MALDI, Pyrolysis, LC/HRMS, GC/MSD, ICP-OES, Microscopy, X-ray, LC/TOF, Capillary electrophoresis

Manufacturer

Industries

Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing

Phthalate Analysis in Accordance with an IEC Standard Method

Applications

| N/A | CDS Analytical

GC/MSD, Pyrolysis

Instrumentation

GC/MSD, Pyrolysis

Manufacturer

CDS Analytical

Industries

Semiconductor Analysis