Applications from the field of Semiconductor Analysis - page 1

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications

| 2026 | Metrohm

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Instrumentation

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Mott-Schottky Analysis

Applications

| 2024 | Metrohm

Electrochemistry

Instrumentation

Electrochemistry

Manufacturer

Metrohm

Industries

Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Determination of trace anions in hydrofluoric acid, ammonium fluoride, and a buffered oxide etchant

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Workflow for Migrating OLED Impurity Profiling from R&D to QC Setting with Solvent Compatible Mass Detector System

Technical notes

| 2019 | Waters

LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ

Instrumentation

LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/SQ

Manufacturer

Waters

Industries

Materials Testing, Semiconductor Analysis

Eastern Analytical Symposium & Exposition 2023 Abstract Book

Others

| 2023 | EAS

HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Microscopy, RAMAN Spectroscopy

Instrumentation

HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Microscopy, RAMAN Spectroscopy

Manufacturer

Industries

Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing

CHIRAL PURIFICATION OF IRIDIUM (III) COMPLEXES BY SFC

Posters

| 2019 | Waters (Pittcon)

HPLC, SFC

Instrumentation

HPLC, SFC

Manufacturer

Waters

Industries

Materials Testing, Semiconductor Analysis