Applications from the field of Semiconductor Analysis - page 1

Carbon and Oxygen Quantification in Silicon wafers

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications
| 2015 | Agilent Technologies
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Infrared Photoluminescence Spectroscopy

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis

Evaluating Silicon using Raman Microscopy

Applications
| 2024 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis

Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

Applications
| 2016 | Shimadzu
GC/MSD, Pyrolysis, GC/SQ
Instrumentation
GC/MSD, Pyrolysis, GC/SQ
Manufacturer
Shimadzu, Frontier Lab
Industries
Semiconductor Analysis

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Technical notes
| 2021 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike