Applications from the field of Semiconductor Analysis | LabRulez ICPMS

A Dynamic Lab Servicing the Semiconductor Industry

Others

| 2022 | Savillex

Sample Preparation, Consumables

Instrumentation

Sample Preparation, Consumables

Manufacturer

Savillex

Industries

Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

Applications from the field of Semiconductor Analysis | LabRulez ICPMS

A Dynamic Lab Servicing the Semiconductor Industry

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Optical Characterization of Materials Using Spectroscopy

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

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